发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor device which can reduce contamination of metal generated in the ashing process. SOLUTION: In the method of manufacturing semiconductor device, an organic film formed on a semiconductor substrate 20 arranged within a chamber 20 is ashed using plasma consisting of the gas including oxygen, and a carbon-containing film 26a consisting of the material including carbon is formed to the internal wall of the chamber 20. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005093565(A) 申请公布日期 2005.04.07
申请号 JP20030322201 申请日期 2003.09.12
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 JOEI MASAHIRO
分类号 G03F7/42;H01L21/027;H01L21/304;H01L21/3065;(IPC1-7):H01L21/027;H01L21/306 主分类号 G03F7/42
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