发明名称 |
METHOD FOR CVD EPITAXIAL GROWTH |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for CVD epitaxial growth by which the concentration of an impurity can be uniformized without rotating a substrate. SOLUTION: In this CVD epitaxial method of SiC, the difference between the temperature of a gas on the upstream side of a substrate and the temperature of the gas on the downstream side of the substrate is adjusted to 0-200°C. In addition, it is preferable that the difference between the central temperature of the gas existing on the substrate and the temperature of the substrate is≤200°C and the central temperature of the gas is≥1,300°C. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005093478(A) |
申请公布日期 |
2005.04.07 |
申请号 |
JP20030320820 |
申请日期 |
2003.09.12 |
申请人 |
SHIKUSUON:KK;KANSAI ELECTRIC POWER CO INC:THE;SUMITOMO ELECTRIC IND LTD;MITSUBISHI CORP |
发明人 |
SHIOMI HIROSHI;HARADA MAKOTO;KINOSHITA HIROYUKI;SASAKI MAKOTO;HAYASHI TOSHIHIKO |
分类号 |
H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
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