发明名称 Shallow trench isolation (STI) region with high-K liner and method of formation
摘要 A shallow trench isolation region formed in a layer of semiconductor material. The shallow trench isolation region includes a trench formed in the layer of semiconductor material, the trench being defined by sidewalls and a bottom; a liner within the trench formed from a high-K material, the liner conforming to the sidewalls and bottom of the trench; and a fill section made from isolating material, and disposed within and conforming to the high-K liner. A method of forming the shallow trench isolation region is also disclosed.
申请公布号 US2005073022(A1) 申请公布日期 2005.04.07
申请号 US20030642916 申请日期 2003.08.18
申请人 KARLSSON OLOV B.;WANG HAIHONG;YU BIN;KRIVOKAPIC ZORAN;XIANG QI 发明人 KARLSSON OLOV B.;WANG HAIHONG;YU BIN;KRIVOKAPIC ZORAN;XIANG QI
分类号 H01L21/762;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L29/00 主分类号 H01L21/762
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