| 摘要 |
The invention provides a test apparatus for testing circuit units (101) to be tested by means of a test system, a circuit unit (101) to be tested having a register device (114), in which it is possible to store initialization data (115) that are fed by means of a storage signal (110), a control unit (102) for controlling a storage of the initialization data (115) and a switch-on unit (103) for switching on the at least one circuit unit (101) to be tested, a static storage device (201) for nonvolatile storage of the initialization data (115) that are fed by means of the storage signal (110) further being arranged in the circuit unit (101) to be tested.
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