发明名称 |
METHOD FOR CVD EPITAXIAL GROWTH |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for CVD epitaxial growth by which the thickness of a crystal growth film can be uniformized without rotating a substrate. SOLUTION: In the method for the CVD epitaxial growth of SiC, the partial pressure of a gas containing x mol Si in a 1 mol material gas is adjusted to≥33.33/x(Pa) when the gas is used as a feed gas. In this case, it is preferable that the difference between the central temperature of the gas existing on a substrate and the temperature of the substrate is≤200°C and the central temperature of the gas is≥1,300°C. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005093477(A) |
申请公布日期 |
2005.04.07 |
申请号 |
JP20030320819 |
申请日期 |
2003.09.12 |
申请人 |
SHIKUSUON:KK;KANSAI ELECTRIC POWER CO INC:THE;SUMITOMO ELECTRIC IND LTD;MITSUBISHI CORP |
发明人 |
SHIOMI HIROSHI;HARADA MAKOTO;KINOSHITA HIROYUKI;SASAKI MAKOTO;HAYASHI TOSHIHIKO |
分类号 |
C23C16/32;H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
C23C16/32 |
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