发明名称 METHOD FOR CVD EPITAXIAL GROWTH
摘要 PROBLEM TO BE SOLVED: To provide a method for CVD epitaxial growth by which the thickness of a crystal growth film can be uniformized without rotating a substrate. SOLUTION: In the method for the CVD epitaxial growth of SiC, the partial pressure of a gas containing x mol Si in a 1 mol material gas is adjusted to≥33.33/x(Pa) when the gas is used as a feed gas. In this case, it is preferable that the difference between the central temperature of the gas existing on a substrate and the temperature of the substrate is≤200°C and the central temperature of the gas is≥1,300°C. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005093477(A) 申请公布日期 2005.04.07
申请号 JP20030320819 申请日期 2003.09.12
申请人 SHIKUSUON:KK;KANSAI ELECTRIC POWER CO INC:THE;SUMITOMO ELECTRIC IND LTD;MITSUBISHI CORP 发明人 SHIOMI HIROSHI;HARADA MAKOTO;KINOSHITA HIROYUKI;SASAKI MAKOTO;HAYASHI TOSHIHIKO
分类号 C23C16/32;H01L21/205;(IPC1-7):H01L21/205 主分类号 C23C16/32
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