发明名称 Method of treating the surface of semiconductor devices for improving the noise characteristics
摘要 After etching a silicon surface it is immediately immersed in an alcoholic solution of the triethyl or trimethyl ester of boric acid and then dried at 80-150 DEG C. The boron compound should preferably be an electron acceptor and thus be able to combine with surface electrons. In the embodiment, a (111) surface is treated. Gaseous BF3 may also be used.
申请公布号 US3392050(A) 申请公布日期 1968.07.09
申请号 US19660534227 申请日期 1966.03.14
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BEYERLEIN FRITZ-WERNER
分类号 C23C22/02;H01L23/31 主分类号 C23C22/02
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