发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>A nonvolatile semiconductor memory device and a manufacturing method thereof are provided to form stably a fine stack gate structure regardless of a thin floating gate layer and an Al2O3 layer used as an inter-gate dielectric by arranging properly isolation layers on a semiconductor substrate. A nonvolatile semiconductor memory device includes a plurality of memory cell transistors and isolation layers. Each memory cell transistor includes a floating gate(8), a control gate(2) and an inter-gate dielectric(7) between the floating gate and the control gate. At this time, the floating gate is arranged in a bit line direction. The isolation layers(28) are regularly arranged in a word line direction. The control gate is continuously arranged in the word line direction and the inter-gate dielectric is arranged in the bit line direction.</p>
申请公布号 KR20050031953(A) 申请公布日期 2005.04.06
申请号 KR20040076936 申请日期 2004.09.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SAKUMA, MAKOTO;SATO, ATSUHIRO
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 G11C16/04
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