发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>A nonvolatile semiconductor memory device and a manufacturing method thereof are provided to form stably a fine stack gate structure regardless of a thin floating gate layer and an Al2O3 layer used as an inter-gate dielectric by arranging properly isolation layers on a semiconductor substrate. A nonvolatile semiconductor memory device includes a plurality of memory cell transistors and isolation layers. Each memory cell transistor includes a floating gate(8), a control gate(2) and an inter-gate dielectric(7) between the floating gate and the control gate. At this time, the floating gate is arranged in a bit line direction. The isolation layers(28) are regularly arranged in a word line direction. The control gate is continuously arranged in the word line direction and the inter-gate dielectric is arranged in the bit line direction.</p> |
申请公布号 |
KR20050031953(A) |
申请公布日期 |
2005.04.06 |
申请号 |
KR20040076936 |
申请日期 |
2004.09.24 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SAKUMA, MAKOTO;SATO, ATSUHIRO |
分类号 |
G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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