发明名称 Method for fabricating semiconductor device
摘要 In the step of thermally processing a semiconductor substrate by irradiating the semiconductor substrate with lamp light, a free carrier absorption layer for absorbing the irradiated lamp light is provided in advance in the semiconductor substrate. Thus, it is possible to increase the temperature controllability in a low temperature range during an RTP process, and to reduce, at a low cost, variations in the substrate temperature not only in a low temperature range but also in a processing temperature range. As a result, semiconductor devices that require precise thermal processing can be fabricated without degrading the characteristics of the resulting semiconductor devices.
申请公布号 US6875623(B2) 申请公布日期 2005.04.05
申请号 US20030602918 申请日期 2003.06.25
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NIWAYAMA MASAHIKO;YONEDA KENJI
分类号 H01L21/265;H01L21/26;H01L21/268;H01L21/324;(IPC1-7):H01L31/26;H01L21/66 主分类号 H01L21/265
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