| 摘要 |
A printed circuit board test fixture that includes a mounting plate which supports a printed circuit board to be tested is provided. A probe support plate holder, positioned above the mounting plate, mechanically couples to a probe support plate and holds the probe support plate opposite the mounting plate. A base plate is positioned below the mounting plate. At least three alignment sliders are included, with each alignment slider including a guide rail and a runner block slidably coupled to the guide rail. The guide rails are coupled to the base plate. The runner blocks are coupled to the mounting plate to thereby allow for movement of the mounting plate only along an axis perpendicular to a plane of the mounting plate. Multiple balancing sliders coupled to the base plate and positioned at a back end of the printed circuit board test fixture.
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