发明名称 PACKING STRUCTURE OF ELECTRONIC DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To visually check an electronic device and test its performance without unpacking the packed electronic device. SOLUTION: A packing structure of the electronic device 3 includes the device 3, cushioning members 4 and 5 directly or indirectly engaging with a plurality of regions of an outer case of the device 3, and a packing box 1 for storing the device 3 and the members 4 and 5 while the members 4 and 5 are engaged with the device 3. A window 7 through which the electronic device 3 can be visually checked while the device 3 is being stored in the box 1 is provided on the box 1. The window 7 is vertically and laterally movably supported on the box 1. In addition, a transparent film or a transparent plate is attached to the window 7. Further, the electronic device 3 has a display screen 2 and displays on the screen with a power source received from a power supply means 11 and a video signal received from a video signal supply means 12. The window 7 is provided on the side of the display screen 2 of the packing box 1. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005082194(A) 申请公布日期 2005.03.31
申请号 JP20030316289 申请日期 2003.09.09
申请人 SHARP CORP 发明人 ATSUMI TADAMICHI
分类号 B65D85/68;B65D5/52;B65D77/26;(IPC1-7):B65D77/26 主分类号 B65D85/68
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