发明名称 Low resistance T-shaped ridge structure
摘要 A method and apparatus to provide a low resistance interconnect. A void is defined in the sacrificial layer that is proximate to an active layer. An overgrowth layer is formed in the void and over portions of the sacrificial layer adjacent to the void. A ridge section is defined in the overgrowth layer and portions of the sacrificial layer are removed to define a shank section in the overgrowth layer under the ridge section. The ridge section having a greater lateral dimension than the shank section to reduce electrical resistance between the active layer and electrical interconnects to be electrically coupled to the ridge section.
申请公布号 US2005070113(A1) 申请公布日期 2005.03.31
申请号 US20030671815 申请日期 2003.09.26
申请人 HANBERG PETER J. 发明人 HANBERG PETER J.
分类号 H01L21/285;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/285
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