发明名称 |
Method for fabricating wafer-level chip scale packages |
摘要 |
A method for fabricating wafer-level chip scale packages is disclosed. A plurality of sacrificial photoresists with supporting surfaces in strip or bump configuration are formed on a surface of a wafer. Then, a negative photoresist layer is covered on the sacrificial photoresists. The negative photoresist layer is patterned in order to form a plurality of dielectric supporting bars on supporting surfaces of the sacrificial photoresists. Thereafter, a plurality of metal bars are formed on the dielectric supporting bars. Then the sacrificial photoresists are removed in order to form a plurality of pin terminals of the wafer-level chip scale packages for elastically surface-mounting to substrate or printed circuit board.
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申请公布号 |
US2005070049(A1) |
申请公布日期 |
2005.03.31 |
申请号 |
US20030671771 |
申请日期 |
2003.09.29 |
申请人 |
CHENG S. J.;LIU AN-HONG;WANG YEONG-HER;TSENG YUAN-PING;LEE Y. J. |
发明人 |
CHENG S. J.;LIU AN-HONG;WANG YEONG-HER;TSENG YUAN-PING;LEE Y. J. |
分类号 |
H01L21/44;H01L21/60;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/44 |
代理机构 |
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代理人 |
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地址 |
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