发明名称 |
THICKNESS MEASURING INSTRUMENT AND THICKNESS MEASURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a compact thickness measuring instrument of high energy efficiency and a thickness measuring method for measuring precisely a local thickness of a substance noncontactly, irrespective of a material of the measured substance, and measuring even a very thin substance or film. SOLUTION: This thickness measuring instrument for the substance M comprises: a vibration generating means 10 for generating vibration in the substance M; a vibration detecting means 13 for detecting the vibration in an inside of the substance M generated by the vibration generating means 10; and a frequency analyzing means 15 for calculating a resonance frequency of the substance M, based on the vibration detected by the vibration detecting means 13. The vibration generating means 10 is provided with a light irradiation part for emitting light of a wavelength absorbed by the substance M toward the the substance M. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005083774(A) |
申请公布日期 |
2005.03.31 |
申请号 |
JP20030313350 |
申请日期 |
2003.09.05 |
申请人 |
TECHNO NETWORK SHIKOKU CO LTD;FUTEC INC |
发明人 |
ISHIMARU ICHIRO;OKUDA TAKAHIRO |
分类号 |
G01B17/02;G01B11/06;G01N29/00;(IPC1-7):G01B17/02 |
主分类号 |
G01B17/02 |
代理机构 |
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主权项 |
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地址 |
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