发明名称 Semiconductor device and method of fabricating semiconductor device
摘要 A method of fabricating a semiconductor device according to the present invention includes a step A of forming a polycrystalline or amorphous preliminary semiconductor layer on a surface of a substrate so as to have an opening portion and a step B of simultaneously forming an epitaxial growth layer on an exposed portion of a surface of the substrate through the opening portion and a non-epitaxial growth layer on the preliminary semiconductor layer using a CVD method while heating the substrate inside a reaction chamber by means of a heat source inside the reaction chamber, the epitaxial growth layer being made of single crystalline semiconductor, and the non-epitaxial growth layer being comprised of a polycrystalline or amorphous semiconductor layer.
申请公布号 US2005066887(A1) 申请公布日期 2005.03.31
申请号 US20030359553 申请日期 2003.02.07
申请人 SAITOH TOHRU;NOZAWA KATSUYA;KUBO MINORU;AOKI SHIGETAKA 发明人 SAITOH TOHRU;NOZAWA KATSUYA;KUBO MINORU;AOKI SHIGETAKA
分类号 H01L21/20;H01L21/205;H01L21/331;(IPC1-7):H01L21/331;H01L31/033;H01L29/739 主分类号 H01L21/20
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