发明名称 |
DEPOSITING METHOD FOR INORGANIC ALIGNMENT LAYER, INORGANIC ALIGNMENT LAYER, SUBSTRATE FOR ELECTRONIC DEVICE, LIQUID CRYSTAL PANEL, AND ELECTRONIC EQUIPMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide an inorganic alignment layer having excellent light fastness and capable of generating a pretilt angle, to provide a substrate for an electronic device, a liquid crystal panel and an electronic equipment provided with the inorganic alignment layer and to provide a depositing method for the inorganic alignment layer. SOLUTION: The depositing method for the inorganic alignment layer wherein the inorganic alignment layer is deposited on a base material has a first milling step for irradiating the surface of the base material on which the inorganic alignment layer is to be deposited with an ion beam from a direction inclined at a prescribed angleθ<SB>a</SB>to the vertical direction of the surface, a film-depositing step for depositing a film constituted principally of an inorganic material on the base material which has been irradiated with the ion beam and a second milling step for irradiating the surface of the film with an ion beam from a direction inclined by a prescribed angleθ<SB>b</SB>to the vertical direction of the surface. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005084144(A) |
申请公布日期 |
2005.03.31 |
申请号 |
JP20030313317 |
申请日期 |
2003.09.04 |
申请人 |
SEIKO EPSON CORP |
发明人 |
OTA HIDENOBU;ENDO YUKIHIRO;IWAMOTO OSAMU |
分类号 |
G02F1/1337;C23C14/46;G02F1/133;G02F1/13357;G03B21/00;(IPC1-7):G02F1/133 |
主分类号 |
G02F1/1337 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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