发明名称 DEPOSITING METHOD FOR INORGANIC ALIGNMENT LAYER, INORGANIC ALIGNMENT LAYER, SUBSTRATE FOR ELECTRONIC DEVICE, LIQUID CRYSTAL PANEL, AND ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide an inorganic alignment layer having excellent light fastness and capable of generating a pretilt angle, to provide a substrate for an electronic device, a liquid crystal panel and an electronic equipment provided with the inorganic alignment layer and to provide a depositing method for the inorganic alignment layer. SOLUTION: The depositing method for the inorganic alignment layer wherein the inorganic alignment layer is deposited on a base material has a first milling step for irradiating the surface of the base material on which the inorganic alignment layer is to be deposited with an ion beam from a direction inclined at a prescribed angleθ<SB>a</SB>to the vertical direction of the surface, a film-depositing step for depositing a film constituted principally of an inorganic material on the base material which has been irradiated with the ion beam and a second milling step for irradiating the surface of the film with an ion beam from a direction inclined by a prescribed angleθ<SB>b</SB>to the vertical direction of the surface. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005084144(A) 申请公布日期 2005.03.31
申请号 JP20030313317 申请日期 2003.09.04
申请人 SEIKO EPSON CORP 发明人 OTA HIDENOBU;ENDO YUKIHIRO;IWAMOTO OSAMU
分类号 G02F1/1337;C23C14/46;G02F1/133;G02F1/13357;G03B21/00;(IPC1-7):G02F1/133 主分类号 G02F1/1337
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