发明名称 Selective isotropic etch for titanium-based materials
摘要 A process for etching a sacrificial layer of a structure. The structure is exposed to a plasma derived from nitrogen trifluoride for etching the sacrificial layer. The process is selective in that it etches titanium-nitride and titanium but does not affect adjacent silicon dioxide or aluminum layers. Applications of the process include the formation of integrated circuit structures and MEMS structures.
申请公布号 US2005068608(A1) 申请公布日期 2005.03.31
申请号 US20030675263 申请日期 2003.09.30
申请人 CAMPBELL TIMOTHY S.;CHESIRE DANIEL P.;HINCKLEY KELLY;HEAD GREGORY A.;PATEL BENU B. 发明人 CAMPBELL TIMOTHY S.;CHESIRE DANIEL P.;HINCKLEY KELLY;HEAD GREGORY A.;PATEL BENU B.
分类号 B81B3/00;B81C1/00;C23F4/00;H01L21/3065;H01L21/3213;(IPC1-7):H01L21/00;H01L29/82;G02B6/26 主分类号 B81B3/00
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