发明名称 STRUCTURE OF MAGNETIC MEMORY CELL
摘要 PROBLEM TO BE SOLVED: To provide a means of ensuring correct writing using an MRAM memory cell. SOLUTION: There is included a magnetic memory cell. The magnetic memory cell includes a reference layer (320) having a preset magnetization. A barrier layer (330) is formed adjacent to the reference layer (320). A sense layer (340) is formed adjacent to the barrier layer (330). A first conductive write line (310) is electrically connected to the reference layer (320). The magnetic memory cell further includes a second conductive write line (350) having a gap, the gap being filled by at least a portion of the sense layer (340). A write current conducting through the second conductive write line (350) is at least partially conducted through the portion of the sense layer (340). The write current raises a temperature of the sense layer (340). COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005086203(A) 申请公布日期 2005.03.31
申请号 JP20040254286 申请日期 2004.09.01
申请人 HEWLETT-PACKARD DEVELOPMENT CO LP 发明人 TRAN LUNG;ANTHONY THOMAS C
分类号 G11C11/15;G11C11/00;G11C11/02;G11C11/16;H01L21/8246;H01L27/105;H01L27/22;H01L43/08;(IPC1-7):H01L27/105 主分类号 G11C11/15
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