发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device for effectively suppressing inter-FG capacitance coupling. SOLUTION: This semiconductor device is provided with a semiconductor substrate 11 having first and second element forming parts 12 parted by an element separating groove 13, first and second lower gate insulating films 21 formed on the first and second element forming parts, first and second FG22a formed on the first and second lower gate insulating films, an element separation insulating film 31 formed in at least the element separating groove, and formed with a recess on the upper face, an upper gate insulating film 23 formed on the surfaces of the first and second FG, and a CG line 26 having parts formed so as to be faced to the first and second FG through the upper gate insulating film and a part formed in the recess. The whole side face of the first FG faced to the second FG is matched with the side face parted by the element separating groove of the first element forming part, and the whole side face of the second FG faced to the first FG is matched with the side face parted by the element separating groove of the second element forming part. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005085996(A) 申请公布日期 2005.03.31
申请号 JP20030316794 申请日期 2003.09.09
申请人 TOSHIBA CORP 发明人 KITAMURA YOSHINORI;SUGIMOTO SHIGEKI
分类号 H01L21/00;H01L21/28;H01L21/331;H01L21/82;H01L21/8222;H01L21/8247;H01L27/115;H01L29/76;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/00
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