发明名称 |
Circuit and method for measuring jitter of high speed signals |
摘要 |
A method and circuit for measuring a statistical value of jitter for a data signal having a data rate fD, comprises digitally sampling the data signal at a sampling rate, fS, to produce sampled logic values, where fD/fS is a predetermined non-integer ratio; and analyzing the sampled values to deduce a statistical value of the jitter.
|
申请公布号 |
US2005069031(A1) |
申请公布日期 |
2005.03.31 |
申请号 |
US20040947189 |
申请日期 |
2004.09.23 |
申请人 |
SUNTER STEPHEN K.;ROY AUBIN P.J. |
发明人 |
SUNTER STEPHEN K.;ROY AUBIN P.J. |
分类号 |
H04L1/20;H04Q1/20;(IPC1-7):H04Q1/20 |
主分类号 |
H04L1/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|