发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device having an easy-to-fabricate HEMT capable of performing an enhancement-mode operation, and also to provide a method of fabricating the device. <P>SOLUTION: In a nitride-based semiconductor, the height of a Schottky barrierΦ<SB>B</SB>markedly changes with respect to the work function of a metalΦ<SB>M</SB>, unlike GaAs and Si. Thus, in the HEMT having a buffer layer 2 and a barrier layer 3 made of the nitride-based semiconductor successively formed on a substrate 1 with a gate electrode 4 formed on the buffer layer 3, for example, the enhancement-mode operation is enabled by selecting a metal of a comparatively high work functionΦ<SB>M</SB>as a metal that makes up the gate electrode 4 and adjusting the thickness of the barrier layer 3 so as to render the height of a Schottky barrierΦ<SB>B</SB>high as compared with the surface potentialΦ<SB>S</SB>of the semiconductor on both sides of the gate electrode 4, because secondary electron gas is blocked from existing under the gate electrode 4 without forming a recess in the region of the barrier layer 3 immediately under the gate electrode 4. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005086171(A) 申请公布日期 2005.03.31
申请号 JP20030320071 申请日期 2003.09.11
申请人 FUJITSU LTD 发明人 YAMASHITA YOSHIMI;ENDO SATOSHI;IKEDA KEIJI
分类号 H01L21/335;H01L21/336;H01L21/338;H01L29/20;H01L29/423;H01L29/47;H01L29/778;H01L29/812;H01L29/872;(IPC1-7):H01L21/338 主分类号 H01L21/335
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