发明名称 DEPOSITING METHOD FOR INORGANIC ALIGNMENT LAYER, INORGANIC ALIGNMENT LAYER, SUBSTRATE FOR ELECTRONIC DEVICE, LIQUID CRYSTAL PANEL, AND ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide an inorganic alignment layer having light fastness and capable of generating a pretilt angle, to provide a substrate for an electronic device, a liquid crystal panel and the electronic equipment provided with the inorganic alignment layer and to provide a depositing method for the inorganic alignment layer. SOLUTION: In the depositing method for the inorganic alignment layer wherein the inorganic alignment layer is deposited on a base material by a magnetron sputtering method, pressure of an atmosphere in the vicinity of the base material is made to be≤5×10<SP>-2</SP>Pa, plasma is made to collide against a target provided opposite to the base material to pull out sputtering particles, the base material is irradiated with the sputtering particles in a direction inclined at a prescribed angleθ<SB>s</SB>to the vertical direction of the surface of the base material on which the inorganic alignment layer is to be deposited and the inorganic alignment layer constituted principally of an inorganic material is deposited on the base material. The prescribed angleθ<SB>s</SB>is≥60°. The distance between the base material and the target is≥150 mm. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005084142(A) 申请公布日期 2005.03.31
申请号 JP20030313315 申请日期 2003.09.04
申请人 SEIKO EPSON CORP 发明人 OTA HIDENOBU;ENDO YUKIHIRO
分类号 B32B17/06;C23C14/10;C23C14/22;C23C14/35;G02F1/1337;(IPC1-7):G02F1/133 主分类号 B32B17/06
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