发明名称 SILICON-ON-INSULATOR PHOTODIODE OPTICAL MONITORING SYSTEM FOR COLOR TEMPERATURE CONTROL IN SOLID STATE LIGHT SYSTEMS
摘要 <p>A silicon-on-insulator (SOI) photodiode optical monitoring method and system for color temperature control in solid state light systems. The method includes the steps of providing a plurality of SOI photodiodes, wherein each SO1 photodiode includes a silicon substrate, a buried oxide layer formed on the silicon substrate, and a silicon layer formed on the buried oxide layer, and wherein the silicon layer of each SOI photodiode has a different thickness, determining a proportion of incident light passing through each SOI photodiode to the silicon substrate with respect to wavelength and the thickness of the silicon layer, and calculating color component intensities of the incident light based on the determined proportions.</p>
申请公布号 WO2005029019(A1) 申请公布日期 2005.03.31
申请号 WO2004IB51773 申请日期 2004.09.15
申请人 KONINKLIJKE PHILIPS ELECTRONICS, N.V.;PETRUZZELLO, JOHN;LETAVIC, THEODORE;VEILLETTE, BENOIT 发明人 PETRUZZELLO, JOHN;LETAVIC, THEODORE;VEILLETTE, BENOIT
分类号 G01J1/42;G01J3/28;G01J3/50;H01L31/103;(IPC1-7):G01J3/50 主分类号 G01J1/42
代理机构 代理人
主权项
地址