发明名称 EQUIPMENT FOR CONDITIONING WITH CMP
摘要 A conditioning apparatus for a CMP(Chemical Mechanical Polishing) apparatus is provided to prolong the lifetime of a pad and to reduce fabrication costs by using an ultrasonic generator. A conditioning apparatus includes a polishing pad(11) attached on a polishing table(10), a conditioner(13) for cleaning the polishing pad, a deionized water nozzle(15) for supplying deionized water onto the polishing table, and an ultrasonic generator(16) installed in the polishing table.
申请公布号 KR20050030358(A) 申请公布日期 2005.03.30
申请号 KR20030066669 申请日期 2003.09.25
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 KIM, JIN HWAN
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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