| 摘要 |
A novel method for finding optimized solutions for assigning pins to probes in a constrained tester environment is presented. Given a test system network, including the nodes, probes, pins, resources, probe-to-resource mappings, resource-to-pin mappings, and test-to-resource mappings, and constraints including a Multiple-Resource-Per-Probe Constraint, a Same-Module Constraint, and/or a Multiplexing Constraint, the test system network is modeled as a Network Flow Problem to handle all of the constraints of the constrained pin-to-probe assignment problem, using "dummy" probes where necessary to model the constrained network. A modified Maximum Flow Algorithm that satisfies the network constraints is applied to the Network Flow Problem to generate a solution to said constrained pin-to-probe assignment problem.
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