发明名称 Methods and apparatus for testing a clock signal
摘要 Techniques test a clock signal by comparing different portions of that clock signal to each other. Such techniques enable the detection of a clock signal having anomalies such as missing pulses or occasional delayed pulses. In one arrangement, a data communications device has a clock signal generator, processing circuitry and a test circuit, both of which are coupled to the clock signal generator. The clock signal generator provides a clock signal. The processing circuitry uses the clock signal to receive data elements on a set of input ports, and to transmit the data elements on a set of output ports. The test circuit includes a node that receives the clock signal, a comparison circuit that provides a comparison signal based on a comparison between the clock signal and a delayed copy of the clock signal, and an output circuit that provides a result signal based on the comparison signal.
申请公布号 US6873926(B1) 申请公布日期 2005.03.29
申请号 US20010794453 申请日期 2001.02.27
申请人 CISCO TECHNOLOGY, INC. 发明人 DIAB WAEL
分类号 G01R29/02;(IPC1-7):G01R27/28;G01R19/00;G01R31/00;G01R31/14;G06F15/00 主分类号 G01R29/02
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