发明名称 Method and apparatus for measuring the three-dimensional shape of an object using a moire equipment
摘要 An apparatus and method for measuring a three-dimensional shape of an object using a projection moiré device. The method comprises the steps of obtaining a grid pattern image projected on a reference plane of a moving table and applying a buckets algorithm thereto, thereby achieving a reference phase, obtaining a grid pattern image projected on the object set on the moving table and applying a buckets algorithm thereto, thereby achieving an object phase, calculating a difference phase between the object phase and the reference phase, thereby achieving a moiré phase, and unwrapping the moiré phase, thereby achieving a level information of the object. The apparatus and method measure the three-dimensional shape using a projection grid without a reference grid, thereby achieving compactness of equipment, simplicity in usage and manufacturing cost reduction.
申请公布号 US6873421(B2) 申请公布日期 2005.03.29
申请号 US20020181679 申请日期 2002.07.18
申请人 INTEK PLUS CO., LTD. 发明人 LIM SSANG-GUN;KIM SEUNG-WOO;LEE SANG-YOON;CHUNG CHANG-JIN;CHOI YI-BAE;CHO YOUNG-SIK;PARK KYUNG-KEUN
分类号 G01B11/25;(IPC1-7):G01B11/24 主分类号 G01B11/25
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