DRIVING CIRCUIT OF ELECTROOPTICAL DEVICE, ELECTROOPTICAL DEVICE AND ELECTRONIC EQUIPMENT

摘要

PROBLEM TO BE SOLVED: To reduce an image defect caused by a mutual parastic capacitance among a plurality of thin film transistors in a sampling circuit in a driving circuit of an electrooptical device such as a liquid crystal device.

SOLUTION: The driving circuit of the electrooptical device is provided with: the sampling circuit which includes the plurality of thin film transistors respectively provided with (i) a drain connected with a drain line extended from a data line, (ii) a source connected with a source line extended from an image signal line to the direction of the data line and (iii) a gate pinched between the drain line and the source line and which are arranged corresponding to a plurality of data lines; a data line driving circuit for supplying a sampling circuit driving signal to the gate; and an electromagnetic shield placed in a gap between the two adjacent thin film transistors.

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