发明名称 PHOTOREACTION ANALYZING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a new method for observation of a reaction during exposure and of an accurate reaction during baking and to provide an apparatus therefor. SOLUTION: The photo-reaction analyzing apparatus includes a bake plate, a means to press a sample to the bake plate, a means to irradiate the sample with exposure energy, a means to irradiate the sample surface with light from a FT-IR light source to measure the FT-IR spectrum of the sample, and a means to pickup the response. The apparatus further includes a means to accurately control the distance between the bake plate and the sample. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005077944(A) 申请公布日期 2005.03.24
申请号 JP20030310495 申请日期 2003.09.02
申请人 RISOTETSUKU JAPAN KK 发明人 SEKIGUCHI ATSUSHI;KONO YOSHIYUKI;MINAMI YOICHI
分类号 G03F7/26;H01L21/027;(IPC1-7):G03F7/26 主分类号 G03F7/26
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