发明名称 Semiconductor device with an insulating layer including deuterium and a manufacturing method thereof
摘要 A semiconductor device with an insulating layer including deuterium comprising: a semiconductor substrate; a gate insulating film including deuterium therein and formed on the semiconductor substrate; diffusion layers formed in the semiconductor substrate and located apart from each other to be adjacent to the gate insulating film; a gate electrode formed on the gate insulating film; a first insulating film including deuterium therein and formed on a side surface of the gate electrode; and a protective layer formed so as to cover the first insulating film.
申请公布号 US2005062113(A1) 申请公布日期 2005.03.24
申请号 US20040802810 申请日期 2004.03.18
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 WATANABE SHINICHI
分类号 H01L27/108;H01L21/28;H01L21/30;H01L21/336;H01L21/8242;H01L29/51;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L27/108
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