发明名称 |
Semiconductor device with an insulating layer including deuterium and a manufacturing method thereof |
摘要 |
A semiconductor device with an insulating layer including deuterium comprising: a semiconductor substrate; a gate insulating film including deuterium therein and formed on the semiconductor substrate; diffusion layers formed in the semiconductor substrate and located apart from each other to be adjacent to the gate insulating film; a gate electrode formed on the gate insulating film; a first insulating film including deuterium therein and formed on a side surface of the gate electrode; and a protective layer formed so as to cover the first insulating film.
|
申请公布号 |
US2005062113(A1) |
申请公布日期 |
2005.03.24 |
申请号 |
US20040802810 |
申请日期 |
2004.03.18 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
WATANABE SHINICHI |
分类号 |
H01L27/108;H01L21/28;H01L21/30;H01L21/336;H01L21/8242;H01L29/51;H01L29/78;(IPC1-7):H01L29/76 |
主分类号 |
H01L27/108 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|