| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic circuit, an inspection device, and an inspection method for electronic circuits capable of performing highly precise inspection in a short time. SOLUTION: For a short inspection device 1, two or more test patterns are prepared beforehand. Each of these patterns is a pattern in which two values are alternately allotted to each input terminal by a predetermined number of pieces for each value. According to the test pattern, voltage is applied by a voltage generating section 11 to each input terminal of a test workpiece 5. The workpiece 5 checks the state of each input terminal by a timer event which is generated in the workpiece, and performs an inspection program by that check result. Namely, the inspection program is performed by the timing of the workpiece 5. The inspection device 1 receives output data from the workpiece 5, and performs conformity judgment in a controller 10 on the basis of the output data. COPYRIGHT: (C)2005,JPO&NCIPI
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