| 摘要 |
PROBLEM TO BE SOLVED: To provide a scanning test circuit which secures setup time or hold time on scan shifting without exerting a delay influence on a circuit to be used for normal operations. SOLUTION: A clock signal 13 is supplied to flip-flops 4 to 6 to be used for the normal operations and the scanning test. Selector-equipped delay circuits 7 to 9 are provided to add a delay time, which is larger than that to be added when the normal operations are performed, to the clock signal 13 when the scanning test is performed. Both the normal operations and the scanning test are thereby operated with ample setup time and hold time secured. COPYRIGHT: (C)2005,JPO&NCIPI
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