发明名称 APPARATUS FOR MEASURING CHARACTERISTIC OF ELECTRONIC COMPONENT AND METHOD FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for measuring a characteristic of an electronic component which suppresses an increase in contact resistance and reduces frequency for replacing a measurement contact, and its method. SOLUTION: The apparatus comprises a transport belt 18 for carrying the electronic component 2 having a plurality of terminals 1, a plurality of contact elements 21b-24b abutting on the terminals 1 of the electronic component 2, one-way rotation mechanisms 21a-24a to which the contact elements 21b-24b are fitted, making the contact elements 21b-24b slidably abut on the terminals 1 of the electronic component 2 without rotation during abutment and rotating the contact elements 21b-24b during removal from the terminals 1, levers 21c-24c movably connecting and holding the one-way rotation mechanism 21a-24a, and a connection mechanism for connecting the levers 21c-24c and a measurement instrument. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005077261(A) 申请公布日期 2005.03.24
申请号 JP20030308544 申请日期 2003.09.01
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SHIMOMURA MOTOO
分类号 G01R31/26;G01R27/02;G01R31/00;(IPC1-7):G01R27/02 主分类号 G01R31/26
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