发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor device, by which an impurity can be introduced into a semiconductor region with a small number of steps and, in addition, a large-sized active matrix substrate can be manufactured with a high yield. SOLUTION: After a solution containing an impurity element is discharged onto the semiconductor region by the droplet discharge method, the semiconductor region is melted by having a laser light irradiated on the region, and at the same time, an impurity region is formed by adding and activating the impurity element. Therefore, the impurity can be introduced into the semiconductor region, while the concentration of the impurity element is controlled even if no vacuum process is performed. Consequently, a thin-film transistor (TFT) can be manufactured on a substrate having a large area and the throughput can be improved. In addition, the large-sized active matrix substrate can be manufactured. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005079299(A) 申请公布日期 2005.03.24
申请号 JP20030307074 申请日期 2003.08.29
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ARAI YASUYUKI;HIZUKA JUNICHI;NEMOTO YUKIE
分类号 H01L21/28;H01L21/22;H01L21/225;H01L21/268;H01L21/288;H01L21/336;H01L29/417;H01L29/423;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L21/225 主分类号 H01L21/28
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