发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To perform an observation of I/O terminals and a contact check with a small number of gates. SOLUTION: A semiconductor integrated circuit device 101 comprising the I/O terminals 104, 114 for inputting and outputting signals to and from an internal circuit 108, and a monitor terminal 103 for monitoring an internal state has transfer gates 107, 117 that can be controlled externally, where one and the other ends are connected to the I/O terminal and monitor terminal, respectively. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005077311(A) 申请公布日期 2005.03.24
申请号 JP20030309904 申请日期 2003.09.02
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NOGUCHI YOSHIHIRO
分类号 G01R31/28;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 主分类号 G01R31/28
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