发明名称 |
Semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory |
摘要 |
Testing circuits each including a comparator for comparing data read from semiconductor memories to be tested with expected value data and thereby detecting coincidences/non-coincidences, and a counter for counting the number of non-coincidences detected are provided on a printed board for burn-in or within semiconductor memories to be tested. The semiconductor memories can be tested by the testing circuits respectively.
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申请公布号 |
US2005063230(A1) |
申请公布日期 |
2005.03.24 |
申请号 |
US20040981463 |
申请日期 |
2004.11.05 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
SEITOH AKIRA |
分类号 |
G11C29/38;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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