发明名称 SPECIMEN EXAMINATION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a specimen examination system capable of securing traceability in circulation of a specimen container without erecting a large-scale computer system formed by networking computers in related organizations wherein the specimen is circulated, and transmitting examination information such as examination items or examination results of the specimen surely and efficiently without fail. <P>SOLUTION: In this specimen examination system for examining the specimen wherein the specimen container 2 is circulated through a manufacturing organization 3 for manufacturing the specimen container 2, a specimen sampling organization 4 for sampling the specimen, and an examination organization 5 for examining the specimen, a storage medium 1 capable of reading and writing information is provided on the specimen container 2, and circulation information of the specimen container and examination information of the specimen are managed. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005077354(A) 申请公布日期 2005.03.24
申请号 JP20030311130 申请日期 2003.09.03
申请人 NIPRO CORP 发明人 SEKINE SHIGERU
分类号 G01N35/02;G06K17/00;G06Q50/22 主分类号 G01N35/02
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