发明名称 |
TESTING METHOD AND APPARATUS THEREOF FOR IPM OF PDP |
摘要 |
A testing method and a testing apparatus for an intelligent power module for a plasma display panel are provided to allow for a mass production of plasma display panel by judging a normality of operation of the intelligent power module and significantly shortening testing time. A testing apparatus comprises a load unit(400), a power source unit(100), a signal unit(200), and a testing unit(300). The load unit includes a film capacitor and an inductor which are coupled in serial. The film capacitor has a capacitance same as that of a plasma display panel. The power source unit is constituted by an input noise filter for supplying stable power to the load unit and the signal unit. The signal unit includes an erasable programmable logic device section(201) and a dip switch section(202) for receiving power from the power source unit and generating signals. The testing unit reads the waveform output from an intelligent power module and judges whether the intelligent power module operates in a normal way.
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申请公布号 |
KR20050028976(A) |
申请公布日期 |
2005.03.24 |
申请号 |
KR20030064673 |
申请日期 |
2003.09.18 |
申请人 |
FINE SPN CO., LTD. |
发明人 |
KIM, CHANG HUN;KIM, SUN WHAN;OH, PIL KYOUNG |
分类号 |
H01J9/42;(IPC1-7):H01J9/42 |
主分类号 |
H01J9/42 |
代理机构 |
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