<p>A testing apparatus for testing devices comprises a timing generator part for generating a timing signal indicative of the timing at which to apply a test signal; a plurality of timing delay parts for delaying the timing signals; a plurality of drivers for applying the test signals; a sampler for sampling the test signals to output a sampling voltages; a comparator for outputting a comparison result indicative of whether the sampling voltages are higher than a reference voltage; a determining part for determining whether the sampling voltages are coincident with the reference voltage; and a timing calibration part for calibrating the delay times of the timing signals provided by the plurality of timing delay parts such that the timings at which to apply the test signals to the tested devices are coincident with each other.</p>
