发明名称 |
Indirect stimulation of an integrated circuit die |
摘要 |
Analysis of a semiconductor die is enhanced by the stimulation the die and the detection of a response to the stimulation. According to an example embodiment of the present invention, a semiconductor die is analyzed using indirect stimulation of a portion of the die, and detecting a response therefrom. First, selected portion of circuitry within the die is stimulated. The stimulation of the selected portion induces a second portion of circuitry within the die to generate an external emission. The emission is detected and the die is analyzed therefrom. In one particular implementation, a response from the selected portion is inhibited from interfering with the detection of the emission from the second portion of circuitry.
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申请公布号 |
US6870379(B1) |
申请公布日期 |
2005.03.22 |
申请号 |
US20020164739 |
申请日期 |
2002.06.06 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
DAVIS BRENNAN V.;BRUCE VICTORIA J.;BRUCE MICHAEL R.;RING ROSALINDA M.;EPPES DAVID H. |
分类号 |
G01R31/311;(IPC1-7):G01R31/302;G01R31/26 |
主分类号 |
G01R31/311 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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