| 摘要 |
In a semiconductor device, after the deposition of an interlayer insulating film is deposited on a substrate on which an element and wiring of a lower layer are provided, a via hole reaching to the wiring and an annular groove reaching to an annular pad are formed in the interlayer insulating film, in the internal element region and in the chip area outer periphery region, respectively. Next, by etching using a photoresist pattern formed on the inetrlayer insulating film as a mask, a larger groove for use in wiring than the via hole is formed in the internal element region. At this time, a portion of the annular groove, positioned in the side portion of the chip area outer periphery region, is filled with a portion of the photoresist pattern, thereby decreasing the amount of Cu and the like released from the bottom of the annular groove.
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