发明名称 Defect management system and method
摘要 A defect management system and method includes a centralized database operatively connected to operator, troubleshooter, reworker and inspector workstations via a network. A defect information management application program is installed on the workstations and generates graphical user interfaces that permits the operator, troubleshooter, reworker, and inspectors to log and coordinate defect information. Modules being manufactured may exhibit symptoms of a defect. The symptom and symptom category are logged into the database by the operator. A troubleshooter reviews the logged symptom information to aid in the diagnosis and entry of defect category and defect information. The symptom and defect information are associated with various processes and process steps to accurately track defect module information. A reworker reviews the logged symptom and defect information to determine appropriate repairs. Repair action categories and repair actions are then logged by the reworker. An inspector reviews the logged symptom, defect and repair action information to provide feedback on whether the repair was successful.
申请公布号 US6871326(B1) 申请公布日期 2005.03.22
申请号 US20010827994 申请日期 2001.04.06
申请人 CIENA CORPORATION 发明人 KAZEMI NIAKAM
分类号 G06F15/00;G06Q10/00;(IPC1-7):G06F15/00 主分类号 G06F15/00
代理机构 代理人
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