发明名称 |
Method and device for monitoring electric components in a pick-and-place device for substrates |
摘要 |
A method and device are for monitoring electric components in a pick-and-place device for substrates. The underside of a pick-up is monitored by an optical scanner during the pick-up phase and during the placing phase of a component. A lift drive for the pick-up is provided with a position sensor that is linked with a control device. The scanner emits and receives a scanning beam oriented transversally to the direction of lift and is likewise coupled with the control device, thereby allowing monitoring of the underside of the pick-up in a direct time-related manner with the picking and placing of the component. The various lift positions are saved and compared when a threshold value of the received scanning beam is exceeded so that the inventive device also allows for a monitoring of the height of the component. |
申请公布号 |
US6870622(B2) |
申请公布日期 |
2005.03.22 |
申请号 |
US20020240041 |
申请日期 |
2002.09.27 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
BURGER STEFAN;DUEBEL RAINER |
分类号 |
G01B11/00;H05K13/04;H05K13/08;(IPC1-7):G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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