发明名称 Chip scale marker and marking method
摘要 A chip scale marker includes a laser system performing laser marking, a wafer holder on which a wafer subject to the laser marking is mounted, the wafer holder comprising a vacuum plate disposed at a center of the wafer holder for sucking the wafer and a wafer rotating unit provided at a circumference of the vacuum plate and having an open area facing the laser system, a camera disposed above the wafer holder to photograph the wafer, and a warpage removing unit provided above the wafer holder for removing warpage from the wafer.
申请公布号 US6870127(B2) 申请公布日期 2005.03.22
申请号 US20030610911 申请日期 2003.07.02
申请人 EO TECHNICS CO., LTD. 发明人 HAN YOU HIE;JUN CHANG SU;MIN YANG GHI
分类号 H01L21/02;B23K26/08;H01L21/00;H01L23/544;(IPC1-7):B23K26/00;B23K26/14;B23K26/16;B23K26/18 主分类号 H01L21/02
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