发明名称 BAKING APPARATUS IN PHOTOLITHOGRAPHY PROCESS AND OPERATING METHOD THEREOF
摘要 A baking apparatus in a semiconductor wafer process and an operating method thereof are provided to improve contamination of an exhaust line by exhausting fumes including photoresist elements from a baking oven to the outside. A baking oven(100) is used for evaporating a solvent of a photoresist coated on a wafer. An exhaust line(120) is connected to the baking oven. A cleaning compound supply unit(110) is installed at one end of the exhaust line. A cleaning compound collection tank(130) is installed at one end of the exhaust line in order to collect the cleaning compound. A vacuum ejector(140) is installed at one end of the exhaust line and is operated together with the cleaning compound collection tank.
申请公布号 KR20050028183(A) 申请公布日期 2005.03.22
申请号 KR20030064567 申请日期 2003.09.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, SOON YEAN;CHOI, DUG KYU
分类号 H01L21/324;(IPC1-7):H01L21/324 主分类号 H01L21/324
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