发明名称 |
BAKING APPARATUS IN PHOTOLITHOGRAPHY PROCESS AND OPERATING METHOD THEREOF |
摘要 |
A baking apparatus in a semiconductor wafer process and an operating method thereof are provided to improve contamination of an exhaust line by exhausting fumes including photoresist elements from a baking oven to the outside. A baking oven(100) is used for evaporating a solvent of a photoresist coated on a wafer. An exhaust line(120) is connected to the baking oven. A cleaning compound supply unit(110) is installed at one end of the exhaust line. A cleaning compound collection tank(130) is installed at one end of the exhaust line in order to collect the cleaning compound. A vacuum ejector(140) is installed at one end of the exhaust line and is operated together with the cleaning compound collection tank.
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申请公布号 |
KR20050028183(A) |
申请公布日期 |
2005.03.22 |
申请号 |
KR20030064567 |
申请日期 |
2003.09.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, SOON YEAN;CHOI, DUG KYU |
分类号 |
H01L21/324;(IPC1-7):H01L21/324 |
主分类号 |
H01L21/324 |
代理机构 |
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主权项 |
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地址 |
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