| 摘要 |
PROBLEM TO BE SOLVED: To enhance test quality when test data for a scan-based testing method consist of random numbers and to statically specify and extract portions that degrade the test quality, without using simulations. SOLUTION: This design support device includes an input means 301 for inputting function description data on a register transfer level; a syntax analysis means 302 for analyzing the syntax of the function description data and developing it into a parse tree; and a means 303 for scanning and searching the parse tree 306 developed by the syntax analysis means for multi-bit comparison operation descriptions from which faults are difficult to detect, based on pseudo random number test data applied from the pseudo random number generator of a logic BIST. In addition, a knowledge-based library in which description formats to be searched for are stored in rule formats may be installed. COPYRIGHT: (C)2005,JPO&NCIPI
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