发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 In a flash memory, a threshold voltage of a memory transistor is decreased quickly by increasing a rising speed of a pulse voltage of an erasing pulse signal train during the first period of an erasing operation. In response to the threshold voltage of the memory transistor becoming lower than a threshold voltage of a reference transistor, the threshold voltage of the memory transistor is decreased slowly by reducing the rising speed of the pulse voltage of the erasing pulse signal train. Therefore, the erasing time can be reduced and depletion of the memory transistor can be prevented.
申请公布号 US2005057969(A1) 申请公布日期 2005.03.17
申请号 US20030660789 申请日期 2003.09.12
申请人 RENESAS TECHNOLOGY CORP. 发明人 NITTA FUMIHIKO;KOBAYASHI SHINICHI
分类号 G11C11/34;G11C16/10;G11C16/28;G11C16/34;(IPC1-7):G11C11/34 主分类号 G11C11/34
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