发明名称 |
MANUFACTURING METHOD OF SOI WAFER AND SOI WAFER |
摘要 |
PROBLEM TO BE SOLVED: To easily and inexpensively provide an SOI wafer whose electric reliability in a device manufacturing process is high and heat generated during a device operation can efficiently be diffused. SOLUTION: In the SOI wafer, a silicon active layer is formed at least on a support substrate through an insulating film or directly. The silicon active layer and/or the support substrate is formed of silicon single crystal. The SOI wafer has 92.3% or above isotope<SP>28</SP>Si content. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005072108(A) |
申请公布日期 |
2005.03.17 |
申请号 |
JP20030296835 |
申请日期 |
2003.08.20 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
USHIO SATOSHI;YAMAGISHI HIROTOSHI |
分类号 |
H01L21/762;H01L21/02;H01L21/76;H01L27/12;(IPC1-7):H01L27/12 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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