发明名称 MANUFACTURING METHOD OF SOI WAFER AND SOI WAFER
摘要 PROBLEM TO BE SOLVED: To easily and inexpensively provide an SOI wafer whose electric reliability in a device manufacturing process is high and heat generated during a device operation can efficiently be diffused. SOLUTION: In the SOI wafer, a silicon active layer is formed at least on a support substrate through an insulating film or directly. The silicon active layer and/or the support substrate is formed of silicon single crystal. The SOI wafer has 92.3% or above isotope<SP>28</SP>Si content. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005072108(A) 申请公布日期 2005.03.17
申请号 JP20030296835 申请日期 2003.08.20
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 USHIO SATOSHI;YAMAGISHI HIROTOSHI
分类号 H01L21/762;H01L21/02;H01L21/76;H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L21/762
代理机构 代理人
主权项
地址