发明名称 COMPONENT MEASURING/ANALYZING APPARATUS AND SPECIMEN PLATE FOR THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To rapidly and precisely carry specimens to a specimen dropping section or a component measuring/analyzing section, and to efficiently execute high reliable component measuring/analyzing processes, without complicating structures. <P>SOLUTION: A component measuring/analyzing apparatus is provided with a specimen plate carrying passage 24 which is made up linearly and receives a rectangle-shaped specimen plate 100 so that it can be reciprocated; the specimen dropping section 31 which is disposed at a first position of the specimen plate carrying passage 24 in its longitudinal direction and drops a specimen; the component measuring/analyzing section 32 which is disposed at a second position differing from the first position of the specimen plate carrying passage 24 in the longitudinal direction and executes the component measuring/analyzing process for the specimen; and pinions 56, 57 directly driving the specimen plate 100 which is put in the specimen plate carrying passage 24, in the longitudinal direction of the specimen plate carrying passage 24. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005069915(A) 申请公布日期 2005.03.17
申请号 JP20030300965 申请日期 2003.08.26
申请人 SAGINOMIYA SEISAKUSHO INC 发明人 TAKAYANAGI RYOICHIRO
分类号 G01N33/483;G01N21/27;G01N21/35;G01N33/72;G01N35/04;(IPC1-7):G01N35/04 主分类号 G01N33/483
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