发明名称 IMPROVED METHOD OF ETCHING SILICON
摘要 <p>Silicon (12) is etched through a mask (11) comprising a layer of organic resin material (such as novolac) through which openings (32) are formed in the areas to be etched. The layer of organic resin is first deposited over a free surface of the device to be etched. The openings (32) are then formed by depositing droplets of a caustic etchant such as sodium hydroxide (NaOH) or potassium hydroxide (KOH) with an inkjet printer. The etchant reacts with the resin to expose the silicon surface in areas to be etched. The etching of the silicon surface is performed by applying a dilute solution of hydrofluoric acid (HF) and potassium permanganate (KMnO4) to the exposed surface through the openings in the mask to etch the silicon to a desired depth (83).</p>
申请公布号 WO2005024927(A1) 申请公布日期 2005.03.17
申请号 WO2004AU01216 申请日期 2004.09.09
申请人 CSG SOLAR, AG;YOUNG, TREVOR, LINDSAY 发明人 YOUNG, TREVOR, LINDSAY
分类号 H01L21/308;H01L21/3213;H01L21/467;H01L27/142;H01L31/18;(IPC1-7):H01L21/308 主分类号 H01L21/308
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