发明名称 Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces
摘要 The present disclosure provides methods and apparatus useful in depositing materials on batches of microfeature workpieces. One implementation provides a method in which a quantity of a first precursor gas is introduced to an enclosure at a first enclosure pressure. The pressure within the enclosure is reduced to a second enclosure pressure while introducing a purge gas at a first flow rate. The second enclosure pressure may approach or be equal to a steady-state base pressure of the processing system at the first flow rate. After reducing the pressure, the purge gas flow may be increased to a second flow rate and the enclosure pressure may be increased to a third enclosure pressure. Thereafter, a flow of a second precursor gas may be introduced with a pressure within the enclosure at a fourth enclosure pressure; the third enclosure pressure is desirably within about 10 percent of the fourth enclosure pressure.
申请公布号 US2005059261(A1) 申请公布日期 2005.03.17
申请号 US20030665099 申请日期 2003.09.17
申请人 BASCERI CEM;DOAN TRUNG T.;WEIMER RONALD A.;BEAMAN KEVIN L.;BREINER LYLE D.;ZHENG LINGYI A.;PING ER-XUAN;SARIGIANNIS DEMETRIUS;KUBISTA DAVID J. 发明人 BASCERI CEM;DOAN TRUNG T.;WEIMER RONALD A.;BEAMAN KEVIN L.;BREINER LYLE D.;ZHENG LINGYI A.;PING ER-XUAN;SARIGIANNIS DEMETRIUS;KUBISTA DAVID J.
分类号 C23C16/34;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/34
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